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| Part# | Description | Make | Avail. | Price | Qty. | |
|---|---|---|---|---|---|---|
| MTS-2010i | Cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process | APPLIED TEST RESOURCES | Available | request quote | request quote |